Parameter extraction techniques for the analysis and modeling of resistive memories

David Maldonado; Samuel Aldana; Mireia Bargalló Gonzalez; Francisco Jiménez-Molinos; Francesca Campabadal; Juan Bautista Roldán Aranda

doi:10.1016/j.mee.2022.111876

Parameter extraction techniques for the analysis and modeling of resistive memories

David Maldonado
, Samuel Aldana
, Mireia Bargalló Gonzalez
, Francisco Jiménez-Molinos
, Francesca Campabadal
, Juan Bautista Roldán Aranda

University of Granada
Institut de Microelectrònica de Barcelona, IMB-CNM (CSIC)

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	111876
Journal	Microelectronic Engineering
Volume	265
DOIs	https://doi.org/10.1016/j.mee.2022.111876
Publication status	Published - 15 Sept 2022
Externally published	Yes

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10.1016/j.mee.2022.111876

Cite this

@article{eff987defb6f4ec1a1c6360570478a1a,

title = "Parameter extraction techniques for the analysis and modeling of resistive memories",

author = "David Maldonado and Samuel Aldana and \{Bargall{\'o} Gonzalez\}, Mireia and Francisco Jim{\'e}nez-Molinos and Francesca Campabadal and \{Rold{\'a}n Aranda\}, \{Juan Bautista\}",

year = "2022",

month = sep,

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doi = "10.1016/j.mee.2022.111876",

language = "English",

volume = "265",

pages = "111876",

journal = "Microelectronic Engineering",

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TY - JOUR

T1 - Parameter extraction techniques for the analysis and modeling of resistive memories

AU - Maldonado, David

AU - Aldana, Samuel

AU - Bargalló Gonzalez, Mireia

AU - Jiménez-Molinos, Francisco

AU - Campabadal, Francesca

AU - Roldán Aranda, Juan Bautista

PY - 2022/9/15

Y1 - 2022/9/15

UR - http://dx.doi.org/10.1016/j.mee.2022.111876

U2 - 10.1016/j.mee.2022.111876

DO - 10.1016/j.mee.2022.111876

M3 - Article

SN - 0167-9317

VL - 265

SP - 111876

JO - Microelectronic Engineering

JF - Microelectronic Engineering

ER -

Parameter extraction techniques for the analysis and modeling of resistive memories

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