Photoreflectance spectroscopy study of vertical cavity surface emitting laser structures

M. E. Murtagh; V. Guenebaut; S. Ward; D. Nee; P. V. Kelly; B. O'Looney; F. Murphy; M. Modreanu; S. Westwater; R. Blunt; S. W. Bland

doi:10.1016/j.tsf.2003.10.060

Photoreflectance spectroscopy study of vertical cavity surface emitting laser structures

M. E. Murtagh
, V. Guenebaut
, S. Ward
, D. Nee
, P. V. Kelly
, B. O'Looney
, F. Murphy
, M. Modreanu
, S. Westwater
, R. Blunt
, S. W. Bland

Research output: Contribution to journal › Article › peer-review

Abstract

This paper summarises the application of the laser-based electro-absorptive technique of photoreflectance (PR) for the study of vertical cavity surface emitting lasers (VCSELs). PR results are shown to reveal the technologically important cavity mode and ground state quantum well exciton structures. AlGaAs/GaAs based quantum well VCSELs were examined with and without top mirror layers as a function of laser pump excitation conditions, with results compared with angle-dependent PR data. Cavity mode and quantum well alignments were also studied with reference to the un-modulated reflectance signal as well as correlated with photoluminescence data. The results demonstrate the importance of PR metrology for state-of-art VCSEL characterisation.

Original language	English
Pages (from-to)	148-150
Number of pages	3
Journal	Thin Solid Films
Volume	450
Issue number	1
DOIs	https://doi.org/10.1016/j.tsf.2003.10.060
Publication status	Published - 22 Feb 2004
Event	Proceedings of Symposium M on Optical and X-Ray Metrology - Strasbourg, France Duration: 10 Jun 2003 → 13 Jun 2003

Keywords

Cavity
Photoluminescence
Photoreflectance
Quantum well
VCSEL

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10.1016/j.tsf.2003.10.060

Cite this

@article{15a6d23f0fb049349b873e7948bc7592,

title = "Photoreflectance spectroscopy study of vertical cavity surface emitting laser structures",

abstract = "This paper summarises the application of the laser-based electro-absorptive technique of photoreflectance (PR) for the study of vertical cavity surface emitting lasers (VCSELs). PR results are shown to reveal the technologically important cavity mode and ground state quantum well exciton structures. AlGaAs/GaAs based quantum well VCSELs were examined with and without top mirror layers as a function of laser pump excitation conditions, with results compared with angle-dependent PR data. Cavity mode and quantum well alignments were also studied with reference to the un-modulated reflectance signal as well as correlated with photoluminescence data. The results demonstrate the importance of PR metrology for state-of-art VCSEL characterisation.",

keywords = "Cavity, Photoluminescence, Photoreflectance, Quantum well, VCSEL",

author = "Murtagh, \{M. E.\} and V. Guenebaut and S. Ward and D. Nee and Kelly, \{P. V.\} and B. O'Looney and F. Murphy and M. Modreanu and S. Westwater and R. Blunt and Bland, \{S. W.\}",

year = "2004",

month = feb,

day = "22",

doi = "10.1016/j.tsf.2003.10.060",

language = "English",

volume = "450",

pages = "148--150",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier B.V.",

number = "1",

note = "Proceedings of Symposium M on Optical and X-Ray Metrology ; Conference date: 10-06-2003 Through 13-06-2003",

}

TY - JOUR

T1 - Photoreflectance spectroscopy study of vertical cavity surface emitting laser structures

AU - Murtagh, M. E.

AU - Guenebaut, V.

AU - Ward, S.

AU - Nee, D.

AU - Kelly, P. V.

AU - O'Looney, B.

AU - Murphy, F.

AU - Modreanu, M.

AU - Westwater, S.

AU - Blunt, R.

AU - Bland, S. W.

PY - 2004/2/22

Y1 - 2004/2/22

N2 - This paper summarises the application of the laser-based electro-absorptive technique of photoreflectance (PR) for the study of vertical cavity surface emitting lasers (VCSELs). PR results are shown to reveal the technologically important cavity mode and ground state quantum well exciton structures. AlGaAs/GaAs based quantum well VCSELs were examined with and without top mirror layers as a function of laser pump excitation conditions, with results compared with angle-dependent PR data. Cavity mode and quantum well alignments were also studied with reference to the un-modulated reflectance signal as well as correlated with photoluminescence data. The results demonstrate the importance of PR metrology for state-of-art VCSEL characterisation.

AB - This paper summarises the application of the laser-based electro-absorptive technique of photoreflectance (PR) for the study of vertical cavity surface emitting lasers (VCSELs). PR results are shown to reveal the technologically important cavity mode and ground state quantum well exciton structures. AlGaAs/GaAs based quantum well VCSELs were examined with and without top mirror layers as a function of laser pump excitation conditions, with results compared with angle-dependent PR data. Cavity mode and quantum well alignments were also studied with reference to the un-modulated reflectance signal as well as correlated with photoluminescence data. The results demonstrate the importance of PR metrology for state-of-art VCSEL characterisation.

KW - Cavity

KW - Photoluminescence

KW - Photoreflectance

KW - Quantum well

KW - VCSEL

UR - https://www.scopus.com/pages/publications/10744221638

U2 - 10.1016/j.tsf.2003.10.060

DO - 10.1016/j.tsf.2003.10.060

M3 - Article

AN - SCOPUS:10744221638

SN - 0040-6090

VL - 450

SP - 148

EP - 150

JO - Thin Solid Films

JF - Thin Solid Films

IS - 1

T2 - Proceedings of Symposium M on Optical and X-Ray Metrology

Y2 - 10 June 2003 through 13 June 2003

ER -

Photoreflectance spectroscopy study of vertical cavity surface emitting laser structures

Abstract

Keywords

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