Physics-based TCAD analysis of border and interface traps in Al2O3/InGaAs stacks using multifrequency CV-curves

Enrico Caruso; Jun Lin; KF Burke; Karim Cherkaoui; David Esseni; Farzan Gity; Scott Monaghan; Pierpaolo Palestri; Paul K Hurley; Luca Selmi

Physics-based TCAD analysis of border and interface traps in Al2O3/InGaAs stacks using multifrequency CV-curves

Enrico Caruso
, Jun Lin
, KF Burke
, Karim Cherkaoui
, David Esseni
, Farzan Gity
, Scott Monaghan
, Pierpaolo Palestri
, Paul K Hurley
, Luca Selmi

Tyndall MicroNano Systems

Research output: Contribution to journal › Article › peer-review

Original language	Undefined/Unknown
Journal	Meeting Abstracts
Publication status	Published - 2018

Cite this

@article{4c56772391014d4a8fa48d29e1aeb36f,

title = "Physics-based TCAD analysis of border and interface traps in Al2O3/InGaAs stacks using multifrequency CV-curves",

author = "Enrico Caruso and Jun Lin and KF Burke and Karim Cherkaoui and David Esseni and Farzan Gity and Scott Monaghan and Pierpaolo Palestri and Hurley, \{Paul K\} and Luca Selmi",

year = "2018",

language = "Undefined/Unknown",

journal = "Meeting Abstracts",

issn = "1091-8213",

}

TY - JOUR

T1 - Physics-based TCAD analysis of border and interface traps in Al2O3/InGaAs stacks using multifrequency CV-curves

AU - Caruso, Enrico

AU - Lin, Jun

AU - Burke, KF

AU - Cherkaoui, Karim

AU - Esseni, David

AU - Gity, Farzan

AU - Monaghan, Scott

AU - Palestri, Pierpaolo

AU - Hurley, Paul K

AU - Selmi, Luca

PY - 2018

Y1 - 2018

M3 - Article

SN - 1091-8213

JO - Meeting Abstracts

JF - Meeting Abstracts

ER -