Abstract
We report on measurements of stimulated emission in AlInGaN multiquantum wells using ultrafast pump-probe spectroscopy. Low power photoluminescence (PL) of Al0.04 In0.015 Ga0.945 N Al0.12 In0.01 Ga0.87 N multiquantum wells (MQW) yields a single MQW PL peak at 347.2 nm at 10 K. Wavelength degenerate pump-probe measurements show a single exponential decay at excitation densities below the stimulated emission threshold having a recombination decay constant of 160 ps at room temperature. At excitation densities greater than 50 μJ cm2 a biexponential decay is observed, with a fast component (3.3 ps at Iexc =690 μJ cm2) attributed to accelerated relaxation due to stimulated emission. The fractional strength of this fast component indicates that up to 85% of the excited carriers relax via stimulated emission.
| Original language | English |
|---|---|
| Article number | 232106 |
| Pages (from-to) | 1-3 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 87 |
| Issue number | 23 |
| DOIs | |
| Publication status | Published - 2005 |
| Externally published | Yes |