Piezoresponse force microscopy investigations of Aurivillius phase thin films

Lynette Keeney; Panfeng F. Zhang; Claudia Groh; Martyn E. Pemble; Roger W. Whatmore

doi:10.1063/1.3474959

Piezoresponse force microscopy investigations of Aurivillius phase thin films

Lynette Keeney
, Panfeng F. Zhang
, Claudia Groh
, Martyn E. Pemble
, Roger W. Whatmore

Research output: Contribution to journal › Article › peer-review

Abstract

The sol-gel synthesis and characterization of n≥3 Aurivillius phase thin films deposited on Pt/Ti/SiO₂ -Si substrates is described. The number of perovskite layers, n, was increased by inserting BiFeO₃ into three layered Aurivillius phase Bi₄Ti₃ O12 to form compounds such as Bi₅FeTi₃ O15 (n=4). 30% of the Fe ³⁺ ions in Bi₅FeTi₃ O15 were substituted with Mn³⁺ ions to form the structure Bi₅Ti₃ Fe _0.7Mn_0.3O₁₅. The electromechanical responses of the materials were investigated using piezoresponse force microscopy and the results are discussed in relation to the crystallinity of the films as measured by x-ray diffraction.

Original language	English
Article number	042004
Journal	Journal of Applied Physics
Volume	108
Issue number	4
DOIs	https://doi.org/10.1063/1.3474959
Publication status	Published - 15 Aug 2010

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https://hdl.handle.net/10468/2991Licence: CC BY-NC-ND

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title = "Piezoresponse force microscopy investigations of Aurivillius phase thin films",

abstract = "The sol-gel synthesis and characterization of n≥3 Aurivillius phase thin films deposited on Pt/Ti/SiO2 -Si substrates is described. The number of perovskite layers, n, was increased by inserting BiFeO3 into three layered Aurivillius phase Bi4Ti3 O12 to form compounds such as Bi5FeTi3 O15 (n=4). 30\% of the Fe 3+ ions in Bi5FeTi3 O15 were substituted with Mn3+ ions to form the structure Bi5Ti3 Fe 0.7Mn0.3O15. The electromechanical responses of the materials were investigated using piezoresponse force microscopy and the results are discussed in relation to the crystallinity of the films as measured by x-ray diffraction.",

author = "Lynette Keeney and Zhang, \{Panfeng F.\} and Claudia Groh and Pemble, \{Martyn E.\} and Whatmore, \{Roger W.\}",

year = "2010",

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doi = "10.1063/1.3474959",

language = "English",

volume = "108",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

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T1 - Piezoresponse force microscopy investigations of Aurivillius phase thin films

AU - Keeney, Lynette

AU - Zhang, Panfeng F.

AU - Groh, Claudia

AU - Pemble, Martyn E.

AU - Whatmore, Roger W.

PY - 2010/8/15

Y1 - 2010/8/15

N2 - The sol-gel synthesis and characterization of n≥3 Aurivillius phase thin films deposited on Pt/Ti/SiO2 -Si substrates is described. The number of perovskite layers, n, was increased by inserting BiFeO3 into three layered Aurivillius phase Bi4Ti3 O12 to form compounds such as Bi5FeTi3 O15 (n=4). 30% of the Fe 3+ ions in Bi5FeTi3 O15 were substituted with Mn3+ ions to form the structure Bi5Ti3 Fe 0.7Mn0.3O15. The electromechanical responses of the materials were investigated using piezoresponse force microscopy and the results are discussed in relation to the crystallinity of the films as measured by x-ray diffraction.

AB - The sol-gel synthesis and characterization of n≥3 Aurivillius phase thin films deposited on Pt/Ti/SiO2 -Si substrates is described. The number of perovskite layers, n, was increased by inserting BiFeO3 into three layered Aurivillius phase Bi4Ti3 O12 to form compounds such as Bi5FeTi3 O15 (n=4). 30% of the Fe 3+ ions in Bi5FeTi3 O15 were substituted with Mn3+ ions to form the structure Bi5Ti3 Fe 0.7Mn0.3O15. The electromechanical responses of the materials were investigated using piezoresponse force microscopy and the results are discussed in relation to the crystallinity of the films as measured by x-ray diffraction.

UR - https://www.scopus.com/pages/publications/77956301676

U2 - 10.1063/1.3474959

DO - 10.1063/1.3474959

M3 - Article

AN - SCOPUS:77956301676

SN - 0021-8979

VL - 108

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 4

M1 - 042004

ER -

Piezoresponse force microscopy investigations of Aurivillius phase thin films

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