Abstract
We report on metalorganic vapor phase epitaxial growth of InAlN layers on (0001) and (1122) AlN templates at different temperatures (725-800 °C). The indium content (8.0-15.2%) of the (1122)InAlN layers was found to be lower compared to that for the (0001) layers (9.0-23.0%). The higher indium content of the (0001)layers was attributed to a high density of small hillocks and a larger degree of relaxation. The small hillocks on the (0001)layer surface acted as quantum-dot-like structures that caused a stronger emission at longer wavelength compared to weaker emission at shorter wavelength from a "bulk" layer underneath. A large Stokes-shift of about 300 and 480meV was observed for the (0001) and (1122) layers, respectively. The larger shift of the (1122)layers was attributed to a higher degree of localization. The larger degree of localization and higher unintentional oxygen incorporation enhanced the luminescence intensity of the (1122)layers compared to that for the (0001)layers.
| Original language | English |
|---|---|
| Pages (from-to) | 99-104 |
| Number of pages | 6 |
| Journal | Physica Status Solidi (B): Basic Research |
| Volume | 253 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 1 Jan 2016 |
Keywords
- Indium aluminum nitride
- Morphology
- MOVPE
- Semipolar
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