Polycrystalline silicon PhC cavities for CMOS on-chip integration

  • S. Iadanza
  • , G. C.R. Devarapu
  • , A. Blake
  • , P. Acosta Alba
  • , J. M. Pedini
  • , L. O’Faolain

Research output: Contribution to journalArticlepeer-review

Abstract

In this work, we present an on-chip 2D and 3D photonics integration solution compatible with Front End of Line integration (FEOL) using deposited polycrystalline silicon (poly:Si) for optical interconnects applications. Deposited silicon integration on a bulk silicon wafer is here discussed in all its processing steps and configurations. Moreover, results of deposited silicon high-Q Photonic Crystal (PhC) resonators are shown, demonstrating the possibility to employ optical resonators patterned on this material in the next generation of 2D and 3D integrated optical interconnects.

Original languageEnglish
Article number17097
JournalScientific Reports
Volume12
Issue number1
DOIs
Publication statusPublished - Dec 2022

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