Post-breakdown conduction in metal gate/MgO/InP structures

Research output: Chapter in Book/Report/Conference proceedings › Conference proceeding › peer-review

Original language	Undefined/Unknown
Title of host publication	2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
DOIs	https://doi.org/10.1109/IPFA.2009.5232695
Publication status	Published - 2009

Access to Document

@inproceedings{42e9d40fc2524534887c3f4823ece780,

title = "Post-breakdown conduction in metal gate/MgO/InP structures",

author = "Ailbe O'Manachain",

year = "2009",

doi = "10.1109/IPFA.2009.5232695",

language = "Undefined/Unknown",

booktitle = "2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits",

}