Probing intrinsic transport properties of single metal nanowires: Direct-write contact formation using a focused ion beam

G. De Marzi; D. Lacopino; A. J. Quinn; G. Redmond

doi:10.1063/1.1779972

Probing intrinsic transport properties of single metal nanowires: Direct-write contact formation using a focused ion beam

G. De Marzi
, D. Lacopino
, A. J. Quinn
, G. Redmond

University College Cork

Research output: Contribution to journal › Article › peer-review

Abstract

The charge-transport properties of 70-nm-diameter platinum (Pt) nanowires (NW) were investigated using variable-temperature electrical characterization. The sample nanowires were fabricated using a pore-templated electrodeposition process and direct-write contact formation using a focused ion beam (FIB) system. In the NWs, the measured NW room-temperature resistivity indicated that the contributions were due to surface and grain boundary scattering. It was observed from the scanning electron microscopy images of Pt NWs that NWs were crystalline in shape, with a diameter of 70±5 nm and with lengths up to 5 μm.

Original language	English
Pages (from-to)	3458-3462
Number of pages	5
Journal	Journal of Applied Physics
Volume	96
Issue number	6
DOIs	https://doi.org/10.1063/1.1779972
Publication status	Published - 15 Sep 2004

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10.1063/1.1779972

https://hdl.handle.net/10468/4233Licence: CC BY-NC-ND

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title = "Probing intrinsic transport properties of single metal nanowires: Direct-write contact formation using a focused ion beam",

abstract = "The charge-transport properties of 70-nm-diameter platinum (Pt) nanowires (NW) were investigated using variable-temperature electrical characterization. The sample nanowires were fabricated using a pore-templated electrodeposition process and direct-write contact formation using a focused ion beam (FIB) system. In the NWs, the measured NW room-temperature resistivity indicated that the contributions were due to surface and grain boundary scattering. It was observed from the scanning electron microscopy images of Pt NWs that NWs were crystalline in shape, with a diameter of 70±5 nm and with lengths up to 5 μm.",

author = "\{De Marzi\}, G. and D. Lacopino and Quinn, \{A. J.\} and G. Redmond",

year = "2004",

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T1 - Probing intrinsic transport properties of single metal nanowires

T2 - Direct-write contact formation using a focused ion beam

AU - De Marzi, G.

AU - Lacopino, D.

AU - Quinn, A. J.

AU - Redmond, G.

PY - 2004/9/15

Y1 - 2004/9/15

N2 - The charge-transport properties of 70-nm-diameter platinum (Pt) nanowires (NW) were investigated using variable-temperature electrical characterization. The sample nanowires were fabricated using a pore-templated electrodeposition process and direct-write contact formation using a focused ion beam (FIB) system. In the NWs, the measured NW room-temperature resistivity indicated that the contributions were due to surface and grain boundary scattering. It was observed from the scanning electron microscopy images of Pt NWs that NWs were crystalline in shape, with a diameter of 70±5 nm and with lengths up to 5 μm.

AB - The charge-transport properties of 70-nm-diameter platinum (Pt) nanowires (NW) were investigated using variable-temperature electrical characterization. The sample nanowires were fabricated using a pore-templated electrodeposition process and direct-write contact formation using a focused ion beam (FIB) system. In the NWs, the measured NW room-temperature resistivity indicated that the contributions were due to surface and grain boundary scattering. It was observed from the scanning electron microscopy images of Pt NWs that NWs were crystalline in shape, with a diameter of 70±5 nm and with lengths up to 5 μm.

UR - https://www.scopus.com/pages/publications/4944233707

U2 - 10.1063/1.1779972

DO - 10.1063/1.1779972

M3 - Article

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SP - 3458

EP - 3462

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 6

ER -

Probing intrinsic transport properties of single metal nanowires: Direct-write contact formation using a focused ion beam

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