Profiling border-traps by TCAD analysis of multifrequency CV-curves in Al 2 O 3/InGaAs stacks

Research output: Chapter in Book/Report/Conference proceedings › Conference proceeding › peer-review

Original language	Undefined/Unknown
Title of host publication	2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
Publication status	Published - 2018

Cite this

@inproceedings{3b5a1e4d77b4431cad4447c9d66b2448,

title = "Profiling border-traps by TCAD analysis of multifrequency CV-curves in Al 2 O 3/InGaAs stacks",

author = "Ailbe O'Manachain",

year = "2018",

language = "Undefined/Unknown",

booktitle = "2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)",

}