Progress towards photon counting between 1 μm and 1.6 μm using silicon with infra-red absorbers

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Abstract

Silicon based avalanche photodiodes (APDs) have exhibited impressive performance over the visible spectrum for more than a decade. Photon counting with these devices has progressed to the level where room-temperature operation and low dark count rates (< 100 Hz) are commonplace. Several commercial enterprises have been established to capitalise on these devices and many niche markets are now serviced by incorporating these devices into suitable systems. This paper describes one approach that allows the performance of silicon based Geigermode avalanche photodiodes (GM-APDs) to be extended into the near-infra-red. The process development is described whereby Ge absorbers are incorporated into adapted silicon APD designs to provide separate absorption and multiplication devices. Simulation results are presented outlining the performance of these devices at wavelengths between 1 μm and 1.6 μm. The performance results from silicon APD designs are presented for visible wavelengths. A silicon-germanium bonding process is described and the challenges presented in developing the hybrid absorber/multiplier structure are detailed. Finally, a summary of appropriate custom application integrated circuits for various applications is discussed.

Original languageEnglish
Title of host publicationAdvanced Photon Counting Techniques IV
DOIs
Publication statusPublished - 2010
EventAdvanced Photon Counting Techniques IV - Orlando, FL, United States
Duration: 7 Apr 20108 Apr 2010

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7681
ISSN (Print)0277-786X

Conference

ConferenceAdvanced Photon Counting Techniques IV
Country/TerritoryUnited States
CityOrlando, FL
Period7/04/108/04/10

Keywords

  • avalanche photodiodes
  • geiger-mode
  • germanium
  • infra-red
  • photon counting
  • silicon
  • wafer-bonding

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