Properties of Bi4Ti3O12-(Na 1/2Bi1/2)TiO3 piezoelectric ceramics

Alessandra Sanson; Roger W. Whatmore

doi:10.1143/JJAP.41.7127

Properties of Bi₄Ti₃O₁₂-(Na _1/2Bi_1/2)TiO₃ piezoelectric ceramics

Alessandra Sanson
, Roger W. Whatmore

Tyndall Micronano Electronics

Research output: Other output › peer-review

Abstract

Ceramics of the series (1-x)Bi₄Ti₃O ₁₂-x(Na_1/2Bi_1/2TiO₃ (BTO-NBT) were made using a conventional mixed oxide and carbonate process. The structural properties revealed that the system passes through the formation of Aurivillius compounds with increasing number of perovskite blocks for an increasing amount of NBT up to a maximum of four. Regions of coexistence of two layered compounds are also present. A perovskite phase starts to appear, as NBT, at 40%mol BTO. Even at low concentrations (5% BTO) a four layer Aurivillius phase formed together with the perovskite structure. X-ray diffraction (XRD) analysis at low angles (2θ < 20°) proved to be a powerful tool for the identification and characterization of the layered structures, dc resistivity was measured for the composition corresponding to pure phases of the series in the range 15-65°C. The data obtained were interpreted on the basis of the structures of the Aurivillius compounds.

Original language	English
Number of pages	4
Edition	11 B
Volume	41
DOIs	https://doi.org/10.1143/JJAP.41.7127
Publication status	Published - Nov 2002

Publication series

Name	Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Publisher	Institute of Physics
ISSN (Print)	0021-4922

Keywords

Aurivillius compounds
Bismuth titanate
Lead-free ceramics
Low angle XRD analysis
naBi TiOBiTiO

Access to Document

10.1143/JJAP.41.7127

Cite this

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title = "Properties of Bi4Ti3O12-(Na 1/2Bi1/2)TiO3 piezoelectric ceramics",

abstract = "Ceramics of the series (1-x)Bi4Ti3O 12-x(Na1/2Bi1/2TiO3 (BTO-NBT) were made using a conventional mixed oxide and carbonate process. The structural properties revealed that the system passes through the formation of Aurivillius compounds with increasing number of perovskite blocks for an increasing amount of NBT up to a maximum of four. Regions of coexistence of two layered compounds are also present. A perovskite phase starts to appear, as NBT, at 40\%mol BTO. Even at low concentrations (5\% BTO) a four layer Aurivillius phase formed together with the perovskite structure. X-ray diffraction (XRD) analysis at low angles (2θ < 20°) proved to be a powerful tool for the identification and characterization of the layered structures, dc resistivity was measured for the composition corresponding to pure phases of the series in the range 15-65°C. The data obtained were interpreted on the basis of the structures of the Aurivillius compounds.",

keywords = "Aurivillius compounds, Bismuth titanate, Lead-free ceramics, Low angle XRD analysis, naBi TiOBiTiO",

author = "Alessandra Sanson and Whatmore, \{Roger W.\}",

year = "2002",

month = nov,

doi = "10.1143/JJAP.41.7127",

language = "English",

volume = "41",

series = "Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers",

publisher = "Institute of Physics",

edition = "11 B",

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TY - GEN

T1 - Properties of Bi4Ti3O12-(Na 1/2Bi1/2)TiO3 piezoelectric ceramics

AU - Sanson, Alessandra

AU - Whatmore, Roger W.

PY - 2002/11

Y1 - 2002/11

N2 - Ceramics of the series (1-x)Bi4Ti3O 12-x(Na1/2Bi1/2TiO3 (BTO-NBT) were made using a conventional mixed oxide and carbonate process. The structural properties revealed that the system passes through the formation of Aurivillius compounds with increasing number of perovskite blocks for an increasing amount of NBT up to a maximum of four. Regions of coexistence of two layered compounds are also present. A perovskite phase starts to appear, as NBT, at 40%mol BTO. Even at low concentrations (5% BTO) a four layer Aurivillius phase formed together with the perovskite structure. X-ray diffraction (XRD) analysis at low angles (2θ < 20°) proved to be a powerful tool for the identification and characterization of the layered structures, dc resistivity was measured for the composition corresponding to pure phases of the series in the range 15-65°C. The data obtained were interpreted on the basis of the structures of the Aurivillius compounds.

AB - Ceramics of the series (1-x)Bi4Ti3O 12-x(Na1/2Bi1/2TiO3 (BTO-NBT) were made using a conventional mixed oxide and carbonate process. The structural properties revealed that the system passes through the formation of Aurivillius compounds with increasing number of perovskite blocks for an increasing amount of NBT up to a maximum of four. Regions of coexistence of two layered compounds are also present. A perovskite phase starts to appear, as NBT, at 40%mol BTO. Even at low concentrations (5% BTO) a four layer Aurivillius phase formed together with the perovskite structure. X-ray diffraction (XRD) analysis at low angles (2θ < 20°) proved to be a powerful tool for the identification and characterization of the layered structures, dc resistivity was measured for the composition corresponding to pure phases of the series in the range 15-65°C. The data obtained were interpreted on the basis of the structures of the Aurivillius compounds.

KW - Aurivillius compounds

KW - Bismuth titanate

KW - Lead-free ceramics

KW - Low angle XRD analysis

KW - naBi TiOBiTiO

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DO - 10.1143/JJAP.41.7127

M3 - Other output

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VL - 41

T3 - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

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