@article{f41a13be31be402f898b7a9d2e2a5ad7,
title = "Radiation sensitive MOSFETs irradiated with various positive gate biases",
keywords = "Threshold voltage, Irradiation, Optoelectronics, Materials science, Negative-bias temperature instability, Radiation, Gate oxide, Biasing, Transistor, Annealing (glass), Field-effect transistor, Voltage, Analytical Chemistry (journal), Chemistry, Physics, Optics, Quantum mechanics, Chromatography, Nuclear physics, Composite material",
author = "Russell Duane",
year = "2021",
doi = "10.1080/16878507.2021.1970921",
language = "English",
journal = "Journal of Radiation Research and Applied Sciences",
issn = "1687-8507",
}