Skip to main navigation Skip to search Skip to main content

Reflectance anisotropy oscillations of the heteroepitaxial growth of AlAs and Al1-xGaxAs on GaAs(001) surfaces by molecular beam epitaxy

  • A. G. Taylor
  • , A. R. Turner
  • , B. A. Joyce
  • , M. E. Pemble

Research output: Contribution to journalArticlepeer-review

Abstract

Reflectance anisotropy (RA) oscillations observed during the molecular beam epitaxial growth of AlAs and AlGaAs/AlAs heterostructures on singular GaAs(001) substrates have been investigated. A temperature dependence study of the AlAs oscillations was carried out in the temperature range 500-580°C and oscillations of large amplitude were readily detected. The effect of alloy stoichiometry on the oscillation amplitude was investigated and the amplitude was found to decrease as the Ga content of the alloy was increased. The origin of these oscillations is discussed in terms of the microscopic nature of the step edges associated with the islands formed during growth.

Original languageEnglish
Pages (from-to)367-373
Number of pages7
JournalSurface Science
Volume375
Issue number2-3
DOIs
Publication statusPublished - 1 Apr 1997
Externally publishedYes

Keywords

  • Epitaxy
  • Gallium arsenide
  • Molecular beam epitaxy
  • Reflection anisotropy
  • Reflection spectroscopy
  • Semiconductor
  • Single crystal surfaces
  • Surface

Fingerprint

Dive into the research topics of 'Reflectance anisotropy oscillations of the heteroepitaxial growth of AlAs and Al1-xGaxAs on GaAs(001) surfaces by molecular beam epitaxy'. Together they form a unique fingerprint.

Cite this