Reflectance study of SiO2/Si3N4 dielectric Bragg reflectors

  • Anna Szerling
  • , Dorota Wawer
  • , Krzysztof Hejduk
  • , Tomasz Piwoński
  • , Anna Wójcik
  • , Bohdan Mroziewicz
  • , Maciej Bugajski

Research output: Contribution to journalArticlepeer-review

Abstract

We present the results of reflectance investigations into SiO2/Si3N4 dielectric distributed Bragg reflectors (DBR). The dielectric multilayers forming reflectors have been deposited by plasma enhanced chemical vapour deposition (PECVD) on silicon substrates. Such structures can be utilised in vertical cavity surface emitting lasers (VCSELs) and resonant cavity light emitting diodes (RC LEDs).

Original languageEnglish
Pages (from-to)523-527
Number of pages5
JournalOptica Applicata
Volume32
Issue number3
Publication statusPublished - 2002
Externally publishedYes

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