TY - CHAP
T1 - Reliability analysis of memory centric LDPC decoders under probabilistic storage failures
AU - Amaricai, Alexandru
AU - Nimara, Sergiu
AU - Boncalo, Oana
AU - Popovici, Emanuel
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016
Y1 - 2016
N2 - In this paper, we perform a simulated fault injection reliability assessment of memory centric flooded LDPC decoders affected by probabilistic storage errors. We investigate the error correction capability in terms of Frame Error Rate (FER) of faulty flooded Min-Sum decoder, under Binary Additive White Gaussian Noise (BiAWGN) channel model. We have injected all the memories, as well as only the memories associated to each type of message. The analysis indicates that the LDPC decoders are capable to correct errors affecting the memory blocks within the decoder. Furthermore, a graceful degradation of the error correction capability of the decoder can be observed with the increase in the error probabilities can be observed. The results show that, although the error rate is 3 χ smaller in the input LLR memory, they have the strongest impact in the overal reliability of the decoder.
AB - In this paper, we perform a simulated fault injection reliability assessment of memory centric flooded LDPC decoders affected by probabilistic storage errors. We investigate the error correction capability in terms of Frame Error Rate (FER) of faulty flooded Min-Sum decoder, under Binary Additive White Gaussian Noise (BiAWGN) channel model. We have injected all the memories, as well as only the memories associated to each type of message. The analysis indicates that the LDPC decoders are capable to correct errors affecting the memory blocks within the decoder. Furthermore, a graceful degradation of the error correction capability of the decoder can be observed with the increase in the error probabilities can be observed. The results show that, although the error rate is 3 χ smaller in the input LLR memory, they have the strongest impact in the overal reliability of the decoder.
UR - https://www.scopus.com/pages/publications/85015346304
U2 - 10.1109/ICECS.2016.7841271
DO - 10.1109/ICECS.2016.7841271
M3 - Chapter
AN - SCOPUS:85015346304
T3 - 2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016
SP - 592
EP - 595
BT - 2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 23rd IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016
Y2 - 11 December 2016 through 14 December 2016
ER -