Reliable super resolution beam profiler for lasers in manufacturing

Nabeel A. Riza; Farzan N. Ghauri

doi:10.1109/cleo.2005.202308

Reliable super resolution beam profiler for lasers in manufacturing

Nabeel A. Riza
, Farzan N. Ghauri

University of Central Florida

Research output: Chapter in Book/Report/Conference proceedings › Conference proceeding › peer-review

Abstract

Demonstrated is a first of a kind hybrid analog-digital laser beam profiler based on a Digital Micro-Mirror Device. Tests at 1550 nm show a 2 micron profiling resolution over a 600 micron side square zone.

Original language	English
Title of host publication	2005 Conference on Lasers and Electro-Optics, CLEO
Publisher	Optical Society of America (OSA)
Pages	1885-1887
Number of pages	3
ISBN (Print)	1557527954, 9781557527950
DOIs	https://doi.org/10.1109/cleo.2005.202308
Publication status	Published - 2005
Externally published	Yes
Event	2005 Conference on Lasers and Electro-Optics, CLEO - Baltimore, MD, United States Duration: 22 May 2005 → 27 May 2005

Publication series

Name	2005 Conference on Lasers and Electro-Optics, CLEO
Volume	3

Conference

Conference	2005 Conference on Lasers and Electro-Optics, CLEO
Country/Territory	United States
City	Baltimore, MD
Period	22/05/05 → 27/05/05

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 9 Industry, Innovation, and Infrastructure

Access to Document

10.1109/cleo.2005.202308

Cite this

@inproceedings{1ee69559b76d408791997c60427f3297,

title = "Reliable super resolution beam profiler for lasers in manufacturing",

abstract = "Demonstrated is a first of a kind hybrid analog-digital laser beam profiler based on a Digital Micro-Mirror Device. Tests at 1550 nm show a 2 micron profiling resolution over a 600 micron side square zone.",

author = "Riza, \{Nabeel A.\} and Ghauri, \{Farzan N.\}",

year = "2005",

doi = "10.1109/cleo.2005.202308",

language = "English",

isbn = "1557527954",

series = "2005 Conference on Lasers and Electro-Optics, CLEO",

publisher = "Optical Society of America (OSA)",

pages = "1885--1887",

booktitle = "2005 Conference on Lasers and Electro-Optics, CLEO",

note = "2005 Conference on Lasers and Electro-Optics, CLEO ; Conference date: 22-05-2005 Through 27-05-2005",

}

Riza, NA & Ghauri, FN 2005, Reliable super resolution beam profiler for lasers in manufacturing. in 2005 Conference on Lasers and Electro-Optics, CLEO., CThT6, 2005 Conference on Lasers and Electro-Optics, CLEO, vol. 3, Optical Society of America (OSA), pp. 1885-1887, 2005 Conference on Lasers and Electro-Optics, CLEO, Baltimore, MD, United States, 22/05/05. https://doi.org/10.1109/cleo.2005.202308

Reliable super resolution beam profiler for lasers in manufacturing. / Riza, Nabeel A.; Ghauri, Farzan N.
2005 Conference on Lasers and Electro-Optics, CLEO. Optical Society of America (OSA), 2005. p. 1885-1887 CThT6 (2005 Conference on Lasers and Electro-Optics, CLEO; Vol. 3).

Research output: Chapter in Book/Report/Conference proceedings › Conference proceeding › peer-review

TY - GEN

T1 - Reliable super resolution beam profiler for lasers in manufacturing

AU - Riza, Nabeel A.

AU - Ghauri, Farzan N.

PY - 2005

Y1 - 2005

N2 - Demonstrated is a first of a kind hybrid analog-digital laser beam profiler based on a Digital Micro-Mirror Device. Tests at 1550 nm show a 2 micron profiling resolution over a 600 micron side square zone.

AB - Demonstrated is a first of a kind hybrid analog-digital laser beam profiler based on a Digital Micro-Mirror Device. Tests at 1550 nm show a 2 micron profiling resolution over a 600 micron side square zone.

UR - https://www.scopus.com/pages/publications/30944436539

U2 - 10.1109/cleo.2005.202308

DO - 10.1109/cleo.2005.202308

M3 - Conference proceeding

AN - SCOPUS:30944436539

SN - 1557527954

SN - 9781557527950

T3 - 2005 Conference on Lasers and Electro-Optics, CLEO

SP - 1885

EP - 1887

BT - 2005 Conference on Lasers and Electro-Optics, CLEO

PB - Optical Society of America (OSA)

T2 - 2005 Conference on Lasers and Electro-Optics, CLEO

Y2 - 22 May 2005 through 27 May 2005

ER -

Reliable super resolution beam profiler for lasers in manufacturing

Abstract

Publication series

Conference

UN SDGs

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