Reliable super resolution beam profiler for lasers in manufacturing

Research output: Chapter in Book/Report/Conference proceedingsChapterpeer-review

Abstract

Demonstrated is a first of a kind hybrid analog-digital laser beam profiler based on a Digital Micro-Mirror Device. Tests at 1550 nm show a 2 micron profiling resolution over a 600 micron side square zone.

Original languageEnglish
Title of host publicationConference on Lasers and Electro-Optics, CLEO 2005
PublisherOptical Society of America
ISBN (Print)1557527709, 9781557527707
Publication statusPublished - 2005
Externally publishedYes
EventConference on Lasers and Electro-Optics, CLEO 2005 - Baltimore, MD, United States
Duration: 22 May 200522 May 2005

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Conference

ConferenceConference on Lasers and Electro-Optics, CLEO 2005
Country/TerritoryUnited States
CityBaltimore, MD
Period22/05/0522/05/05

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