Reversible online BIST using bidirectional BILBO

Jiaoyan Chen; Dilip P. Vasudevan; Emanuel Popovici; Michel Schellekens

doi:10.1145/1787275.1787333

Reversible online BIST using bidirectional BILBO

Jiaoyan Chen
, Dilip P. Vasudevan
, Emanuel Popovici
, Michel Schellekens

University College Cork

Research output: Chapter in Book/Report/Conference proceedings › Conference proceeding › peer-review

Abstract

Test generation for reversible circuits is currently gaining interest due to its feasibility towards quantum implementation and asymptotically zero-power dissipation. A novel BIST (Built-In-Self-Test) method for reversible circuits is proposed in this paper. New bidirectional D-latch and D-flipflop designs are introduced. A Reversible BILBO (Built-in-Logic-Block-Observer) based on conventional BILBO is designed to facilitate the BIST procedure. The complete test procedure is executed and experimental results are analyzed for both stuck at and missing gate faults (MGF) with 100% fault coverage.

Original language	English
Title of host publication	CF 2010 - Proceedings of the 2010 Computing Frontiers Conference
Pages	257-266
Number of pages	10
DOIs	https://doi.org/10.1145/1787275.1787333
Publication status	Published - 2010
Event	7th ACM International Conference on Computing Frontiers, CF'10 - Bertinoro, Italy Duration: 17 May 2010 → 19 May 2010

Publication series

Name	CF 2010 - Proceedings of the 2010 Computing Frontiers Conference

Conference

Conference	7th ACM International Conference on Computing Frontiers, CF'10
Country/Territory	Italy
City	Bertinoro
Period	17/05/10 → 19/05/10

Keywords

bilbo
bist
reversible logic
testing

Access to Document

10.1145/1787275.1787333

Cite this

@inproceedings{43b5c17d08254d9cb943238f95faa240,

title = "Reversible online BIST using bidirectional BILBO",

abstract = "Test generation for reversible circuits is currently gaining interest due to its feasibility towards quantum implementation and asymptotically zero-power dissipation. A novel BIST (Built-In-Self-Test) method for reversible circuits is proposed in this paper. New bidirectional D-latch and D-flipflop designs are introduced. A Reversible BILBO (Built-in-Logic-Block-Observer) based on conventional BILBO is designed to facilitate the BIST procedure. The complete test procedure is executed and experimental results are analyzed for both stuck at and missing gate faults (MGF) with 100\% fault coverage.",

keywords = "bilbo, bist, reversible logic, testing",

author = "Jiaoyan Chen and Vasudevan, \{Dilip P.\} and Emanuel Popovici and Michel Schellekens",

year = "2010",

doi = "10.1145/1787275.1787333",

language = "English",

isbn = "9781450300445",

series = "CF 2010 - Proceedings of the 2010 Computing Frontiers Conference",

pages = "257--266",

booktitle = "CF 2010 - Proceedings of the 2010 Computing Frontiers Conference",

note = "7th ACM International Conference on Computing Frontiers, CF'10 ; Conference date: 17-05-2010 Through 19-05-2010",

}

Chen, J, Vasudevan, DP, Popovici, E & Schellekens, M 2010, Reversible online BIST using bidirectional BILBO. in CF 2010 - Proceedings of the 2010 Computing Frontiers Conference. CF 2010 - Proceedings of the 2010 Computing Frontiers Conference, pp. 257-266, 7th ACM International Conference on Computing Frontiers, CF'10, Bertinoro, Italy, 17/05/10. https://doi.org/10.1145/1787275.1787333

TY - GEN

T1 - Reversible online BIST using bidirectional BILBO

AU - Chen, Jiaoyan

AU - Vasudevan, Dilip P.

AU - Popovici, Emanuel

AU - Schellekens, Michel

PY - 2010

Y1 - 2010

N2 - Test generation for reversible circuits is currently gaining interest due to its feasibility towards quantum implementation and asymptotically zero-power dissipation. A novel BIST (Built-In-Self-Test) method for reversible circuits is proposed in this paper. New bidirectional D-latch and D-flipflop designs are introduced. A Reversible BILBO (Built-in-Logic-Block-Observer) based on conventional BILBO is designed to facilitate the BIST procedure. The complete test procedure is executed and experimental results are analyzed for both stuck at and missing gate faults (MGF) with 100% fault coverage.

AB - Test generation for reversible circuits is currently gaining interest due to its feasibility towards quantum implementation and asymptotically zero-power dissipation. A novel BIST (Built-In-Self-Test) method for reversible circuits is proposed in this paper. New bidirectional D-latch and D-flipflop designs are introduced. A Reversible BILBO (Built-in-Logic-Block-Observer) based on conventional BILBO is designed to facilitate the BIST procedure. The complete test procedure is executed and experimental results are analyzed for both stuck at and missing gate faults (MGF) with 100% fault coverage.

KW - bilbo

KW - bist

KW - reversible logic

KW - testing

UR - https://www.scopus.com/pages/publications/77954491900

U2 - 10.1145/1787275.1787333

DO - 10.1145/1787275.1787333

M3 - Conference proceeding

AN - SCOPUS:77954491900

SN - 9781450300445

T3 - CF 2010 - Proceedings of the 2010 Computing Frontiers Conference

SP - 257

EP - 266

BT - CF 2010 - Proceedings of the 2010 Computing Frontiers Conference

T2 - 7th ACM International Conference on Computing Frontiers, CF'10

Y2 - 17 May 2010 through 19 May 2010

ER -

Reversible online BIST using bidirectional BILBO

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Keywords

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