RF characterisation of no-clean solder flux residues

Maeve Duffy; Liam Floyd; Paul McCloskey; Cian Ó Mathúna; Karen Tellefsen; Mike Liberatore; A. Sreeram

RF characterisation of no-clean solder flux residues

Maeve Duffy
, Liam Floyd
, Paul McCloskey
, Cian Ó Mathúna
, Karen Tellefsen
, Mike Liberatore
, A. Sreeram

Tyndall IPES (Integrated Power)

University College Cork

Research output: Contribution to journal › Article › peer-review

Abstract

The effects of solder flux residues on the electrical functionality of RF circuit boards are investigated in this paper. The electrical characteristics of the residues are tested in terms of the change in response of microstrip resonator structures caused by their presence. In this way, the corresponding change in effective dielectric constant of microstrip boards is measured, and can be used to predict residue effects on RF circuit performance. Residues deposited from five no-clean solder pastes are tested and compared, using microstrip resonator structures designed for operation over the frequency range from 0.5 - 10 GHz.

Original language	English
Pages (from-to)	138-143
Number of pages	6
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	4587
Publication status	Published - 2001
Event	2001 International Symposium on Microelectronics - Baltimore, MD, United States Duration: 9 Oct 2001 → 11 Oct 2001

Keywords

Dielectric characterisation
Flux residue
No-clean solder
RF characterisation

Cite this

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title = "RF characterisation of no-clean solder flux residues",

abstract = "The effects of solder flux residues on the electrical functionality of RF circuit boards are investigated in this paper. The electrical characteristics of the residues are tested in terms of the change in response of microstrip resonator structures caused by their presence. In this way, the corresponding change in effective dielectric constant of microstrip boards is measured, and can be used to predict residue effects on RF circuit performance. Residues deposited from five no-clean solder pastes are tested and compared, using microstrip resonator structures designed for operation over the frequency range from 0.5 - 10 GHz.",

keywords = "Dielectric characterisation, Flux residue, No-clean solder, RF characterisation",

author = "Maeve Duffy and Liam Floyd and Paul McCloskey and Math{\'u}na, \{Cian {\'O}\} and Karen Tellefsen and Mike Liberatore and A. Sreeram",

year = "2001",

language = "English",

volume = "4587",

pages = "138--143",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "2001 International Symposium on Microelectronics ; Conference date: 09-10-2001 Through 11-10-2001",

}

TY - JOUR

T1 - RF characterisation of no-clean solder flux residues

AU - Duffy, Maeve

AU - Floyd, Liam

AU - McCloskey, Paul

AU - Mathúna, Cian Ó

AU - Tellefsen, Karen

AU - Liberatore, Mike

AU - Sreeram, A.

PY - 2001

Y1 - 2001

N2 - The effects of solder flux residues on the electrical functionality of RF circuit boards are investigated in this paper. The electrical characteristics of the residues are tested in terms of the change in response of microstrip resonator structures caused by their presence. In this way, the corresponding change in effective dielectric constant of microstrip boards is measured, and can be used to predict residue effects on RF circuit performance. Residues deposited from five no-clean solder pastes are tested and compared, using microstrip resonator structures designed for operation over the frequency range from 0.5 - 10 GHz.

AB - The effects of solder flux residues on the electrical functionality of RF circuit boards are investigated in this paper. The electrical characteristics of the residues are tested in terms of the change in response of microstrip resonator structures caused by their presence. In this way, the corresponding change in effective dielectric constant of microstrip boards is measured, and can be used to predict residue effects on RF circuit performance. Residues deposited from five no-clean solder pastes are tested and compared, using microstrip resonator structures designed for operation over the frequency range from 0.5 - 10 GHz.

KW - Dielectric characterisation

KW - Flux residue

KW - No-clean solder

KW - RF characterisation

UR - https://www.scopus.com/pages/publications/0035768577

M3 - Article

AN - SCOPUS:0035768577

SN - 0277-786X

VL - 4587

SP - 138

EP - 143

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - 2001 International Symposium on Microelectronics

Y2 - 9 October 2001 through 11 October 2001

ER -

RF characterisation of no-clean solder flux residues

Abstract

Keywords

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