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Scanning Acoustic Microscopy and SIMS investigation of CdTe detectors

  • J. Barton
  • , T. Randles
  • , S. Hearne
  • , J. Barrett
  • , P. V. Kelly
  • , G. M. Crean
  • , P. Siffert
  • , J. M. Koebel
  • CNRS

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