Scanning the Issue

B. Ai; A. F. Molisch; M. Rupp; Z. D. Zhong; X. Y. Zhang; C. L. Liu; C. Y. Suen; J. Kibilda; A. B. MacKenzie; M. J. Abdel-Rahman; S. K. Yoo; L. Galati Giordano; S. L. Cotton; N. Marchetti; W. Saad; W. G. Scanlon; A. Garcia-Rodriguez; D. Lopez-Perez; H. Claussen; L. A. Dasilva; H. Z. Tan; S. Choi; F. W.Y. Lau; F. Abnousi

doi:10.1109/JPROC.2020.2993418

Scanning the Issue

B. Ai
, A. F. Molisch
, M. Rupp
, Z. D. Zhong
, X. Y. Zhang
, C. L. Liu
, C. Y. Suen
, J. Kibilda
, A. B. MacKenzie
, M. J. Abdel-Rahman
, S. K. Yoo
, L. Galati Giordano
, S. L. Cotton
, N. Marchetti
, W. Saad
, W. G. Scanlon
, A. Garcia-Rodriguez
, D. Lopez-Perez
, H. Claussen
, L. A. Dasilva

H. Z. Tan, S. Choi, F. W.Y. Lau, F. Abnousi

Research output: Contribution to journal › Comment/Debate

Original language	English
Article number	9103327
Pages (from-to)	854-855
Number of pages	2
Journal	Proceedings of the IEEE
Volume	108
Issue number	6
DOIs	https://doi.org/10.1109/JPROC.2020.2993418
Publication status	Published - Jun 2020

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10.1109/JPROC.2020.2993418

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Ai, B., Molisch, A. F., Rupp, M., Zhong, Z. D., Zhang, X. Y., Liu, C. L., Suen, C. Y., Kibilda, J., MacKenzie, A. B., Abdel-Rahman, M. J., Yoo, S. K., Giordano, L. G., Cotton, S. L., Marchetti, N., Saad, W., Scanlon, W. G., Garcia-Rodriguez, A., Lopez-Perez, D., Claussen, H., ... Abnousi, F. (2020). Scanning the Issue. Proceedings of the IEEE, 108(6), 854-855. Article 9103327. https://doi.org/10.1109/JPROC.2020.2993418

@article{94d8ba32497c42f2a774376625f2031f,

title = "Scanning the Issue",

author = "B. Ai and Molisch, \{A. F.\} and M. Rupp and Zhong, \{Z. D.\} and Zhang, \{X. Y.\} and Liu, \{C. L.\} and Suen, \{C. Y.\} and J. Kibilda and MacKenzie, \{A. B.\} and Abdel-Rahman, \{M. J.\} and Yoo, \{S. K.\} and Giordano, \{L. Galati\} and Cotton, \{S. L.\} and N. Marchetti and W. Saad and Scanlon, \{W. G.\} and A. Garcia-Rodriguez and D. Lopez-Perez and H. Claussen and Dasilva, \{L. A.\} and Tan, \{H. Z.\} and S. Choi and Lau, \{F. W.Y.\} and F. Abnousi",

year = "2020",

month = jun,

doi = "10.1109/JPROC.2020.2993418",

language = "English",

volume = "108",

pages = "854--855",

journal = "Proceedings of the IEEE",

issn = "0018-9219",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "6",

}

Ai, B, Molisch, AF, Rupp, M, Zhong, ZD, Zhang, XY, Liu, CL, Suen, CY, Kibilda, J, MacKenzie, AB, Abdel-Rahman, MJ, Yoo, SK, Giordano, LG, Cotton, SL, Marchetti, N, Saad, W, Scanlon, WG, Garcia-Rodriguez, A, Lopez-Perez, D, Claussen, H, Dasilva, LA, Tan, HZ, Choi, S, Lau, FWY & Abnousi, F 2020, 'Scanning the Issue', Proceedings of the IEEE, vol. 108, no. 6, 9103327, pp. 854-855. https://doi.org/10.1109/JPROC.2020.2993418

TY - JOUR

T1 - Scanning the Issue

AU - Ai, B.

AU - Molisch, A. F.

AU - Rupp, M.

AU - Zhong, Z. D.

AU - Zhang, X. Y.

AU - Liu, C. L.

AU - Suen, C. Y.

AU - Kibilda, J.

AU - MacKenzie, A. B.

AU - Abdel-Rahman, M. J.

AU - Yoo, S. K.

AU - Giordano, L. Galati

AU - Cotton, S. L.

AU - Marchetti, N.

AU - Saad, W.

AU - Scanlon, W. G.

AU - Garcia-Rodriguez, A.

AU - Lopez-Perez, D.

AU - Claussen, H.

AU - Dasilva, L. A.

AU - Tan, H. Z.

AU - Choi, S.

AU - Lau, F. W.Y.

AU - Abnousi, F.

PY - 2020/6

Y1 - 2020/6

UR - https://www.scopus.com/pages/publications/85086031632

U2 - 10.1109/JPROC.2020.2993418

DO - 10.1109/JPROC.2020.2993418

M3 - Comment/Debate

AN - SCOPUS:85086031632

SN - 0018-9219

VL - 108

SP - 854

EP - 855

JO - Proceedings of the IEEE

JF - Proceedings of the IEEE

IS - 6

M1 - 9103327

ER -

Scanning the Issue

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