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Schottky barrier height reduction for p-ZnSe contacts by sulfur treatment

  • Masaaki Onomura
  • , Shinji Saito
  • , John Rennie
  • , Yukie Nishikawa
  • , Peter J. Parbrook
  • , Masayuki Ishikawa
  • , Gen Ichi Hatakoshi

Research output: Contribution to journalArticlepeer-review

Abstract

We have demonstrated the relationship between the structural and electrical properties of the chemically treated p-type ZnSe surface. The unstable Se-rich ZnSe surface, formed by an acid etchant, is shown to be removed by sulfur treatment. The sulfur treatment has been found to have the effect of lowering the Schottky barrier height at the Au/p-type ZnSe interface. This barrier lowering has been found to be effective in reducing the operation voltage of the ZnSe-based devices.

Original languageEnglish
Pages (from-to)1428-1430
Number of pages3
JournalJapanese Journal of Applied Physics, Part 2: Letters
Volume35
Issue number2 SUPPL. B
DOIs
Publication statusPublished - Feb 1996
Externally publishedYes

Keywords

  • AES
  • Schottky diode
  • Sulfur
  • Surface treatment
  • ZnSe

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