Abstract
Propose here unique wavelength and hybrid wavelength-polarization and wavelength-polarization-time-multiplexed heterodyne optical interferometers using an internal self-referencing scheme enabling Angstrom level sensitivity optical path-length measurements. As a first step, a proof-of-concept wavelength multiplexed scanning heterodyne interferometer is built to test the surface quality of a test mirror, demonstrating ± 100 Å profile variations with a 0.9 Å accuracy. The hybrid wavelength-polarization and wavelength-polarization-time-multiplexed interferometers can be used to form spectrally coded distributed sensors.
| Original language | English |
|---|---|
| Article number | 125603 |
| Journal | Optical Engineering |
| Volume | 45 |
| Issue number | 12 |
| DOIs | |
| Publication status | Published - Dec 2006 |
| Externally published | Yes |
Keywords
- Acousto-optic deflectors
- Heterodyne optical interferometers
- Optical sensors
- Scanning interferometers
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