Semiconducting nanowires: Properties and architectures

  • D. Erts
  • , B. Polyakov
  • , E. Saks
  • , H. Olin
  • , L. Ryen
  • , K. Ziegler
  • , J. D. Holmes

Research output: Contribution to journalArticlepeer-review

Abstract

The paper describes the use of an in-situ microscopy technique, which combines transmission electron microscopy (TEM) with scanning probe microscopy (SPM), to investigate the electrical and mechanical properties of individual silicon and germanium nanowires. Additionally, the formation of ordered arrays of size-monodisperse silicon and germanium nanowires within mesoporous silica powders and thin films using a supercritical fluid inclusion phase technique is described. In particular, we demonstrate ultra high-density arrays of germanium nanowires, up to 2 x 1012 wires per square centimetre. These matric embedded nano-composite materials display unique optical properties such as intense room temperature ultraviolet and visible photoluminescence.

Original languageEnglish
Pages (from-to)109-116
Number of pages8
JournalSolid State Phenomena
Volume99-100
DOIs
Publication statusPublished - 2004
EventProceedings of Symposium F European Materials Research Society Fall Meeting 2003 - Warsaw, Poland
Duration: 15 Sep 200319 Sep 2003

Keywords

  • Mesoporous materials
  • Nanowire arrays
  • Nanowires
  • Scanning Probe Microscopy
  • TEM-SPM

Fingerprint

Dive into the research topics of 'Semiconducting nanowires: Properties and architectures'. Together they form a unique fingerprint.

Cite this