Sensing properties of surface plasmon resonance in different multilayer Si-based structures

  • Sergiy Patskovsky
  • , Andrei V. Kabashin
  • , Michel Meunier
  • , John H.T. Luong

Research output: Contribution to journalArticlepeer-review

Abstract

The progress in the development of Si-based Surface Plasmon Resonance sensing technology is reported. This technology uses multi-layer structures with a gold film and a silicon prism in the Kretschmann-Raether geometry and makes potentially possible the miniaturization and integration of the sensor device on a silicon-based microplatform. We show conditions of the simultaneous excitation for two plasmon polariton modes over both sides of the gold film using different intermediate layers, between the high-refractive index silicon prism and the gold, and examine their response in configurations of the conventional and nanoparticle-enhanced sensing. The system has been calibrated in real - time measurements of protein (Concanavalin A) adsorption.

Original languageEnglish
Article number60
Pages (from-to)467-473
Number of pages7
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5577
Issue numberPART 2
DOIs
Publication statusPublished - 2004
Externally publishedYes
EventPhotonics North 2004: International Conference on Applications of Photonic Technology, ICAPT - Ottawa, Ont., Canada
Duration: 26 Sep 200429 Sep 2004

Keywords

  • Dispersion
  • Infrared
  • Protein adsorption
  • Silicon
  • Surface plasmon resonance

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