Sensitivity and fading of irradiated RADFETs with different gate voltages
- Goran S. Ristic
- , Stefan D. Ilic
- , Marko S. Andjelkovic
- , Russell Duane
- , Alberto J. Palma
- , Antonio M. Lalena
- , Milos D. Krstic
- , Aleksandar B. Jaksic
- University of Nis
- University of Belgrade
- Innovations for High Performance Microelectronics
- University of Granada
- University of Potsdam
Research output: Contribution to journal › Article › peer-review