TY - GEN
T1 - Series-coupling test characterization of on-chip silicon-integrated and PWB-integrated transformers
AU - Hayes, John G.
AU - Egan, Michael G.
AU - Wang, Ningning
AU - O'Donnell, Terence
PY - 2007
Y1 - 2007
N2 - On-chip silicon-integrated and PWB-integrated transformers are currently being developed for signal and power applications in high-frequency power supplies. Prototype transformers feature relatively high winding resistances, core loss, and leakage inductances compared to conventional transformers. Short-circuit tests have limited use for characterizing these prototype high-parasitic transformers. In this paper, series-coupling tests are developed and applied for the accurate characterization of the resistive and inductive elements of on-chip silicon-integrated and PWB-integrated prototype transformers. In the series-coupling tests, the various resistive and inductive components simply sum together making transformer characterization more direct and robust than attempting to interpret the short-circuit tests. Experimental results are validated by finite-element simulation.
AB - On-chip silicon-integrated and PWB-integrated transformers are currently being developed for signal and power applications in high-frequency power supplies. Prototype transformers feature relatively high winding resistances, core loss, and leakage inductances compared to conventional transformers. Short-circuit tests have limited use for characterizing these prototype high-parasitic transformers. In this paper, series-coupling tests are developed and applied for the accurate characterization of the resistive and inductive elements of on-chip silicon-integrated and PWB-integrated prototype transformers. In the series-coupling tests, the various resistive and inductive components simply sum together making transformer characterization more direct and robust than attempting to interpret the short-circuit tests. Experimental results are validated by finite-element simulation.
UR - https://www.scopus.com/pages/publications/46449122807
U2 - 10.1109/APEX.2007.357501
DO - 10.1109/APEX.2007.357501
M3 - Conference proceeding
AN - SCOPUS:46449122807
SN - 1424407133
SN - 9781424407132
T3 - Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
SP - 97
EP - 103
BT - APEC 2007 - 22nd Annual IEEE Applied Power Electronics Conference and Exposition
T2 - APEC 2007 - 22nd Annual IEEE Applied Power Electronics Conference and Exposition
Y2 - 25 February 2007 through 1 March 2007
ER -