TY - GEN
T1 - Single mode edge-emitting lasers using optical lithography
AU - Percival, C.
AU - Lambkin, P.
AU - Corbett, B.
PY - 2003
Y1 - 2003
N2 - In this paper, we present an optical lithography process that introduces slot perturbations into a ridge waveguide InGaAsP laser. A fast-Fourier transform (FFT) of emission spectra below threshold has been used to verify the location of the slot and can be used as a method for measuring the loss introduced by the slot.
AB - In this paper, we present an optical lithography process that introduces slot perturbations into a ridge waveguide InGaAsP laser. A fast-Fourier transform (FFT) of emission spectra below threshold has been used to verify the location of the slot and can be used as a method for measuring the loss introduced by the slot.
UR - https://www.scopus.com/pages/publications/84891868558
U2 - 10.1109/CLEOE.2003.1312254
DO - 10.1109/CLEOE.2003.1312254
M3 - Conference proceeding
AN - SCOPUS:84891868558
SN - 0780377346
SN - 9780780377349
T3 - Conference on Lasers and Electro-Optics Europe - Technical Digest
SP - 193
BT - 2003 Conference on Lasers and Electro-Optics Europe, CLEO/EUROPE 2003
T2 - 2003 Conference on Lasers and Electro-Optics Europe, CLEO/EUROPE 2003
Y2 - 22 June 2003 through 27 June 2003
ER -