TY - GEN
T1 - Solution structure and dynamics of a semiconductor laser subject to feedback from two external filters
AU - Słowiński, P.
AU - Krauskopf, B.
AU - Wieczorek, S.
PY - 2010
Y1 - 2010
N2 - We present an analysis of a semiconductor laser subject to filtered optical feedback from two filtering elements (2FOF). The motivation for this study comes from applications where two filters are used to control and stabilise the laser output. Compared to a laser with a single filtered optical feedback loop, the introduction of the second filter significantly influences the structure of the basic continuous-wave solutions, which are also known as external filtered modes (EFMs). We compute and represent the EFMs of the underlying delay differential equation model as surfaces in the space of frequency ωs and inversion level Ns of the laser, and feedback phase difference dCp. The quantity dCp is a key parameter since it is associated with interference between the two filter fields and, hence, controls the effective feedback strength. We further show how the EFM surface in (ωs, dCp,Ns)-space changes upon variation of other filter parameters, in particular, the two delay times. Overall, the investigation of the EFM-surface provides a geometric approach to the multi-parameter analysis of the 2FOF laser, which allows for comprehensive insight into the solution structure and dynamics of the system.
AB - We present an analysis of a semiconductor laser subject to filtered optical feedback from two filtering elements (2FOF). The motivation for this study comes from applications where two filters are used to control and stabilise the laser output. Compared to a laser with a single filtered optical feedback loop, the introduction of the second filter significantly influences the structure of the basic continuous-wave solutions, which are also known as external filtered modes (EFMs). We compute and represent the EFMs of the underlying delay differential equation model as surfaces in the space of frequency ωs and inversion level Ns of the laser, and feedback phase difference dCp. The quantity dCp is a key parameter since it is associated with interference between the two filter fields and, hence, controls the effective feedback strength. We further show how the EFM surface in (ωs, dCp,Ns)-space changes upon variation of other filter parameters, in particular, the two delay times. Overall, the investigation of the EFM-surface provides a geometric approach to the multi-parameter analysis of the 2FOF laser, which allows for comprehensive insight into the solution structure and dynamics of the system.
KW - External filtered modes
KW - Filtered feedback
KW - Semiconductor laser
UR - https://www.scopus.com/pages/publications/77957879805
U2 - 10.1117/12.853448
DO - 10.1117/12.853448
M3 - Conference proceeding
AN - SCOPUS:77957879805
SN - 9780819481931
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Semiconductor Lasers and Laser Dynamics IV
T2 - Semiconductor Lasers and Laser Dynamics IV
Y2 - 12 April 2010 through 16 April 2010
ER -