TY - CHAP
T1 - Spatial statistics for micro/nanoelectronics and materials science
AU - Miranda, E.
AU - Jiménez, D.
AU - Suñé, J.
AU - O'Connor, E.
AU - Monaghan, S.
AU - Cherkaoui, K.
AU - Hurley, P. K.
PY - 2012
Y1 - 2012
N2 - Spatial statistics is a specialized branch of statistics aimed to provide information about the locations of randomly distributed objects in 1, 2 or 3 dimensions. The analysis involves data exploration, parameter estimation, model fitting and hypothesis formulation. In particular, in this work, we present some recent advances in the characterization of the spatial distribution of breakdown spots over the gate electrode of Metal-Insulator-Semiconductor and Metal-Insulator-Metal structures. The spots are regarded as a two-dimensional point pattern, which is analyzed using intensity plots, spatial counting methods, inter-event distance histograms and functional summary estimators. The methods reported here are general so that they can be applied to many different research fields.
AB - Spatial statistics is a specialized branch of statistics aimed to provide information about the locations of randomly distributed objects in 1, 2 or 3 dimensions. The analysis involves data exploration, parameter estimation, model fitting and hypothesis formulation. In particular, in this work, we present some recent advances in the characterization of the spatial distribution of breakdown spots over the gate electrode of Metal-Insulator-Semiconductor and Metal-Insulator-Metal structures. The spots are regarded as a two-dimensional point pattern, which is analyzed using intensity plots, spatial counting methods, inter-event distance histograms and functional summary estimators. The methods reported here are general so that they can be applied to many different research fields.
UR - https://www.scopus.com/pages/publications/84864252865
U2 - 10.1109/MIEL.2012.6222790
DO - 10.1109/MIEL.2012.6222790
M3 - Chapter
AN - SCOPUS:84864252865
SN - 9781467302388
T3 - 2012 28th International Conference on Microelectronics - Proceedings, MIEL 2012
SP - 23
EP - 30
BT - 2012 28th International Conference on Microelectronics - Proceedings, MIEL 2012
T2 - 2012 28th International Conference on Microelectronics, MIEL 2012
Y2 - 13 May 2012 through 16 May 2012
ER -