Special issue on “Current Trends in Optical and X-Ray Metrology of Advanced Materials for Nanoscale Devices III”, E-MRS Spring 2012—Symposium W, held in Strasbourg, France, May 14--18, 2012

Mircea Gabriel Modreanu

Special issue on “Current Trends in Optical and X-Ray Metrology of Advanced Materials for Nanoscale Devices III”, E-MRS Spring 2012—Symposium W, held in Strasbourg, France, May 14--18, 2012

Mircea Gabriel Modreanu

Tyndall MicroNano Systems

Research output: Chapter in Book/Report/Conference proceedings › Chapter › peer-review

Original language	Undefined/Unknown
Title of host publication	European Materials Research Society Spring Meeting 2012 (E-MRS 2012 Spring Meeting)
Publication status	Published - 2012

Cite this

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title = "Special issue on “Current Trends in Optical and X-Ray Metrology of Advanced Materials for Nanoscale Devices III”, E-MRS Spring 2012—Symposium W, held in Strasbourg, France, May 14--18, 2012",

author = "Modreanu, \{Mircea Gabriel\}",

year = "2012",

language = "Undefined/Unknown",

booktitle = "European Materials Research Society Spring Meeting 2012 (E-MRS 2012 Spring Meeting)",

}

Special issue on “Current Trends in Optical and X-Ray Metrology of Advanced Materials for Nanoscale Devices III”, E-MRS Spring 2012—Symposium W, held in Strasbourg, France, May 14--18, 2012. / Modreanu, Mircea Gabriel.
European Materials Research Society Spring Meeting 2012 (E-MRS 2012 Spring Meeting). 2012.

Research output: Chapter in Book/Report/Conference proceedings › Chapter › peer-review