@article{fd26bf06eaae49b7a8f1ed31e84309e1,
title = "Special issue on {"}current Trends in Optical and X-Ray Metrology of Advanced Materials for Nanoscale Devices III{"}, E-MRS Spring 2012 - Symposium W, held in Strasbourg, France, May 14-18, 2012",
author = "Mircea Modreanu and Olivier Durand and Jellison, \{Gerald E.\} and Giancarlo Salviati and Miklos Fried",
year = "2013",
month = aug,
day = "31",
doi = "10.1016/j.tsf.2013.07.027",
language = "English",
volume = "541",
pages = "1--2",
journal = "Thin Solid Films",
issn = "0040-6090",
publisher = "Elsevier B.V.",
}