Spectroellipsometric characterization of sol-gel TiO2-CuO thin coatings

  • M. Gartner
  • , R. Scurtu
  • , A. Ghita
  • , M. Zaharescu
  • , M. Modreanu
  • , C. Trapalis
  • , M. Kokkoris
  • , G. Kordas

Research output: Contribution to journalArticlepeer-review

Abstract

TiO2 based nanustructured coatings have been prepared by sol-gel method on glass and SiO2/glass substrates. The films were thermally treated in oxidative and reductive conditions at 500 °C. The influence of the substrate and of the thermal treatment on the optical properties of the films was studied. The samples were characterized by spectroscopic ellipsometry (SE), scanning electron microscopy (SEM), Rutherford backscattering spectroscopy (RBS) and Raman spectroscopy. SE results supported by other optical and structural measurements have proven the transformation of CuO from as-prepared samples into Cu2O in samples heated in oxidative conditions and into metallic Cu in samples heated in reductive conditions as well as the transformation of the amorphous TiO2 in anatase.

Original languageEnglish
Pages (from-to)417-421
Number of pages5
JournalThin Solid Films
Volume455-456
DOIs
Publication statusPublished - 1 May 2004
EventThe 3rd International Conference on Spectroscopic Ellipsometry - Vienna, Austria
Duration: 6 Jul 200311 Jul 2003

Keywords

  • Sol-gel method
  • Spectroscopic ellipsometry
  • Thin coatings
  • TiO-CuO

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