Abstract
The spin polarization of electrons photoemitted from negative electron affinity (NEA) thin GaAs photocathodes has been measured by means of Mott scattering. Thin epitaxial layers have been grown on different substrates with either small or large lattice mis-match. In this last case the layer results considerably strained allowing the emission of highly (more than 50%) polarized electrons. The effect of the strain relaxation due to sample annealing on the beam polarization is also discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 505-509 |
| Number of pages | 5 |
| Journal | Journal of Electron Spectroscopy and Related Phenomena |
| Volume | 76 |
| Issue number | C |
| DOIs | |
| Publication status | Published - 29 Dec 1995 |
| Externally published | Yes |
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