TY - JOUR
T1 - Sr doped Cu2O a new p-type material for photovoltaic applications
AU - Stoica, Mihai
AU - Anastasescu, Mihai
AU - Calderon-Moreno, Jose M.
AU - Nicolescu, Madalina
AU - Osiceanu, Petre
AU - Preda, Silviu
AU - Duta, Maria Covei
AU - Modreanu, Mircea
AU - Gartner, Mariuca
N1 - Publisher Copyright:
© 2018 Editura Academiei Romane.All Rights Reserved.
PY - 2018
Y1 - 2018
N2 - A new class of transparent conductive oxides, namely Sr doped Cu2O (Cu2O-Sr) thin films, have been deposited by Metal Organic Chemical Vapor Deposition (MOCVD) method on glass substrate with 3:1 and 1:1 Sr:Cu molar ratios. The Cu2O-Sr samples were investigated related to structure (X-Ray Diffraction, and Raman Spectroscopy), morphology (AFM and SEM), chemical composition (XPS), optical properties (Spectroscopic Ellipsometry and UV-VIS Spectroscopy) and electrical properties (Hall Effect) in comparison with undoped Cu2O films. The obtained films are adherent and uniform with a thickness in the range of 170-200 nm and exhibit optical transparency of over 80% in the VIS-NIR domain. Besides XPS, the presence of Sr in the films matrix was evidenced by Raman Spectroscopy and Infrared Ellipsometry. Hall Effect measurements emphasized the p-type electrical conductivity of the Cu2O-Sr films, with carrier concentration in the range of 1016-1017 cm-3. The optical constants of the Cu2O-Sr films were obtained over a wide wavelengths range.
AB - A new class of transparent conductive oxides, namely Sr doped Cu2O (Cu2O-Sr) thin films, have been deposited by Metal Organic Chemical Vapor Deposition (MOCVD) method on glass substrate with 3:1 and 1:1 Sr:Cu molar ratios. The Cu2O-Sr samples were investigated related to structure (X-Ray Diffraction, and Raman Spectroscopy), morphology (AFM and SEM), chemical composition (XPS), optical properties (Spectroscopic Ellipsometry and UV-VIS Spectroscopy) and electrical properties (Hall Effect) in comparison with undoped Cu2O films. The obtained films are adherent and uniform with a thickness in the range of 170-200 nm and exhibit optical transparency of over 80% in the VIS-NIR domain. Besides XPS, the presence of Sr in the films matrix was evidenced by Raman Spectroscopy and Infrared Ellipsometry. Hall Effect measurements emphasized the p-type electrical conductivity of the Cu2O-Sr films, with carrier concentration in the range of 1016-1017 cm-3. The optical constants of the Cu2O-Sr films were obtained over a wide wavelengths range.
UR - https://www.scopus.com/pages/publications/85054540431
M3 - Article
AN - SCOPUS:85054540431
SN - 0035-3930
VL - 63
SP - 425
EP - 435
JO - Revue Roumaine de Chimie
JF - Revue Roumaine de Chimie
IS - 5-6
ER -
