Abstract
A new class of transparent conductive oxides, namely Sr doped Cu2O (Cu2O-Sr) thin films, have been deposited by Metal Organic Chemical Vapor Deposition (MOCVD) method on glass substrate with 3:1 and 1:1 Sr:Cu molar ratios. The Cu2O-Sr samples were investigated related to structure (X-Ray Diffraction, and Raman Spectroscopy), morphology (AFM and SEM), chemical composition (XPS), optical properties (Spectroscopic Ellipsometry and UV-VIS Spectroscopy) and electrical properties (Hall Effect) in comparison with undoped Cu2O films. The obtained films are adherent and uniform with a thickness in the range of 170-200 nm and exhibit optical transparency of over 80% in the VIS-NIR domain. Besides XPS, the presence of Sr in the films matrix was evidenced by Raman Spectroscopy and Infrared Ellipsometry. Hall Effect measurements emphasized the p-type electrical conductivity of the Cu2O-Sr films, with carrier concentration in the range of 1016-1017 cm-3. The optical constants of the Cu2O-Sr films were obtained over a wide wavelengths range.
| Original language | English |
|---|---|
| Pages (from-to) | 425-435 |
| Number of pages | 11 |
| Journal | Revue Roumaine de Chimie |
| Volume | 63 |
| Issue number | 5-6 |
| Publication status | Published - 2018 |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 7 Affordable and Clean Energy
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