Stabilization of self-focusing instability in wide-aperture semiconductor lasers

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Abstract

Stabilization of self-focusing in wide-aperture semiconductor lasers was analyzed. The mechanism occurred when the carrier density was profiled in the transverse direction. The laser structure consisted of a wide-aperture edge-emitting laser diode which operated in pulsed mode to avoid thermal guiding effects. The injection current profile was changed from the step-function case to a Lorentzian-like profile by including a 10 μm p-type epitaxial spreading layer. The resulting nonlinear transverse mode and the possibility of its observation in two transverse dimensions was also discussed.

Original languageEnglish
Article number053807
Pages (from-to)538071-538075
Number of pages5
JournalPhysical Review A - Atomic, Molecular, and Optical Physics
Volume65
Issue number5 B
Publication statusPublished - May 2002

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