Stop Sweeping It Under the Rug! Revealing the Hidden Phases and Elements of 2D Material Interfaces with Atom Probe Tomography

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
JournalMicroscopy and Microanalysis
DOIs
Publication statusPublished - 2025

Keywords

  • Atom probe
  • Atom (system on chip)
  • Materials science
  • Tomography
  • Crystallography
  • Nanotechnology
  • Physics
  • Computer science
  • Optics
  • Chemistry
  • Embedded system
  • Transmission electron microscopy

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