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Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope

  • C. Trager-Cowan
  • , A. Alasamari
  • , W. Avis
  • , J. Bruckbauer
  • , P. R. Edwards
  • , G. Ferenczi
  • , B. Hourahine
  • , A. Kotzai
  • , S. Kraeusel
  • , G. Kusch
  • , R. W. Martin
  • , R. McDermott
  • , G. Naresh-Kumar
  • , M. Nouf-Allehiani
  • , E. Pascal
  • , D. Thomson
  • , S. Vespucci
  • , M. D. Smith
  • , P. J. Parbrook
  • , J. Enslin
    • F. Mehnke, C. Kuhn, T. Wernicke, M. Kneissl, S. Hagedorn, A. Knauer, S. Walde, M. Weyers, P. M. Coulon, P. A. Shields, J. Bai, Y. Gong, L. Jiu, Y. Zhang, R. M. Smith, T. Wang, A. Winkelmann

Research output: Contribution to journal › Article › peer-review

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