| Original language | Undefined/Unknown |
|---|---|
| Title of host publication | 2012 13th International Conference on Ultimate Integration on Silicon (ULIS) |
| DOIs | |
| Publication status | Published - 2012 |
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Study of interface and oxide defects in high-k/In 0.53 Ga 0.47 As n-MOSFETs
Research output: Chapter in Book/Report/Conference proceedings › Conference proceeding › peer-review