Study of the electrical parameters drift due to mechanical stress in coupled conductors path on flexible polymeric substrate

  • H. M.R. Giannetta
  • , G. Maroli
  • , S. Pazos
  • , S. Boyeras
  • , F. Aguirre
  • , A. Fontana
  • , M. Volpe
  • , A. Oliva
  • , B. Mandal
  • , B. Augustine
  • , M. D. Perez
  • , R. Augustine
  • , P. Julian
  • , F. Palumbo

Research output: Chapter in Book/Report/Conference proceedingsChapterpeer-review

Abstract

In this work, the behavior of the drift in electrical impedance values of a coupled device constituting a flat rectangular inductor surrounded by a coupled antenna while subjected to mechanical stresses of over 10,000 bending-stretching cycles has been studied. It has shown correlation with mechanical aging and also is influenced by temperature variations on the device surface. The impact of the mechanical stress was studied separately for the bending-stretching and relaxation phases, considering in both cases the effect of temperature changes and mechanical stress, in order to obtain an adjustment equation for the measured experimental data. From the fit, it was observed that when using an exponential function for the drift effect due to mechanical stress, the experimental curve was fitted with R2=0.91 for the bending-stretching phase and R2=0.79 for the relaxation phase.

Original languageEnglish
Title of host publication2022 Argentine Conference on Electronics, CAE 2022 - Congreso Argentino de Electronica 2022
EditorsPedro Julian, Andreas G. Andreou
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages37-40
Number of pages4
ISBN (Electronic)9781728173351
DOIs
Publication statusPublished - 2022
Externally publishedYes
Event2022 Argentine Conference on Electronics, CAE 2022 - La Rioja, Argentina
Duration: 10 Mar 202211 Mar 2022

Publication series

Name2022 Argentine Conference on Electronics, CAE 2022 - Congreso Argentino de Electronica 2022

Conference

Conference2022 Argentine Conference on Electronics, CAE 2022
Country/TerritoryArgentina
CityLa Rioja
Period10/03/2211/03/22

Keywords

  • Bending-stretching mechanical stress
  • Degradation
  • Electrical impedance drift
  • Exponential fitting
  • Flexible electronics

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