Study of the growth conditions and characterization of CaCu2Ox and SrCu2Ox thin films

  • C. Millon
  • , J. L. Deschanvres
  • , C. Jiménez
  • , N. Macsporran
  • , B. Servet
  • , O. Durand
  • , M. Modreanu

Research output: Contribution to journalArticlepeer-review

Abstract

MCu2O2 (M = Ca, Ba, Mg, Sr) are promising materials for the development of new p-type transparent conductive oxide thin films. We report on a study of the growth conditions of MCu2Ox (M = Ca, Sr) thin films by injection MOCVD and on the characterization of their structural properties. By using calcium or strontium, and copper tetramethylheptanedionate as precursors dissolved in meta-xylene, cuprate films added with either calcium or strontium have been grown by injection MOCVD in the 450 °C-750 °C deposition temperature range. The main factors for the deposition of films presenting good adherence and a high mirror reflection effect are the deposition temperature and the oxygen partial pressure during deposition. As-deposited Ca-based films are mainly composed of CaCu2O3 or a mixture of CaCO3, CaO, CuO and Cu2O, depending on the oxygen partial pressure and Sr-based films are composed of SrCO3, CuO. Different annealing under argon atmosphere has been performed in order to obtain the searched phase, which needs the reduction of copper in the 1+ oxidation state. We have succeeded to obtain SrCu2O2 phase by Rapid Thermal Processing but did not achieve to obtain the Ca-based compound.

Original languageEnglish
Pages (from-to)9395-9399
Number of pages5
JournalSurface and Coatings Technology
Volume201
Issue number22-23 SPEC. ISS.
DOIs
Publication statusPublished - 25 Sep 2007

Keywords

  • Thin films
  • Transparent conductive oxides
  • XRD

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