Abstract
Demonstrated for the first time is a hybrid analog-digital laser beam profiler based on analog fine motion of a digital micromirror device (DMD) and within-chip digital micromirror controls. The profiler can operate with high-power watt-level laser beams, providing both submicron-level high resolution and wide area profiling coverage. The demonstrated profiler tested over a 600-μm zone using a 1550-nm Gaussian beam shows a 2-μm profiling edge movement resolution limited by the analog motion mechanics.
| Original language | English |
|---|---|
| Pages (from-to) | 1492-1494 |
| Number of pages | 3 |
| Journal | IEEE Photonics Technology Letters |
| Volume | 17 |
| Issue number | 7 |
| DOIs | |
| Publication status | Published - Jul 2005 |
| Externally published | Yes |
Keywords
- Digital micromirror device (DMD)
- Laser beams
- Laser measurement applications
- Laser measurements