TY - CHAP
T1 - SVM detection of epileptiform activity in routine EEG
AU - Kelleher, Daniel
AU - Temko, Andriy
AU - Nash, Derek
AU - McNamara, Brian
AU - Marnane, William
PY - 2010
Y1 - 2010
N2 - Routine electroencephalogram (EEG) is an important test in aiding the diagnosis of patients with suspected epilepsy. These recordings typically last 20-40 minutes, during which signs of abnormal activity (spikes, sharp waves) are looked for in the EEG trace. It is essential that events of short duration are detected during the routine EEG test. The work presented in this paper examines the effect of changing a range of input values to the detection system on its ability to distinguish between normal and abnormal EEG activity. It is shown that the length of analysis window in the range of 0.5s to 1s are well suited to the task. Additionally, it is reported that patient specific systems should be used where possible due to their better performance.
AB - Routine electroencephalogram (EEG) is an important test in aiding the diagnosis of patients with suspected epilepsy. These recordings typically last 20-40 minutes, during which signs of abnormal activity (spikes, sharp waves) are looked for in the EEG trace. It is essential that events of short duration are detected during the routine EEG test. The work presented in this paper examines the effect of changing a range of input values to the detection system on its ability to distinguish between normal and abnormal EEG activity. It is shown that the length of analysis window in the range of 0.5s to 1s are well suited to the task. Additionally, it is reported that patient specific systems should be used where possible due to their better performance.
UR - https://www.scopus.com/pages/publications/78650823393
U2 - 10.1109/IEMBS.2010.5627297
DO - 10.1109/IEMBS.2010.5627297
M3 - Chapter
C2 - 21096695
AN - SCOPUS:78650823393
SN - 9781424441235
T3 - 2010 Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC'10
SP - 6369
EP - 6372
BT - 2010 Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC'10
T2 - 2010 32nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC'10
Y2 - 31 August 2010 through 4 September 2010
ER -