Synthesis and characterization of Al4SiC4: A “new” wide band gap semiconductor material

  • D. Zevgitis
  • , O. Chaix-Pluchery
  • , B. Doisneau
  • , M. Modreanu
  • , J. La Manna
  • , E. Sarigiannidou
  • , D. Chaussende

Research output: Chapter in Book/Report/Conference proceedingsChapterpeer-review

Abstract

High temperature solution growth of Al4SiC4 single crystals was carried out from the melt of silicon and aluminium pieces in a graphite crucible used as carbon source (typically 1800°C under 1 bar of argon). The obtained crystals, in the mm scale, were then characterized by a variety of techniques including: Raman spectroscopy, transmission electron microscopy techniques, X-ray diffraction and UV-Vis-NIR spectroscopy. A good structural quality was revealed by TEM, ensuring a well resolved Raman spectrum. The UV-Vis transmission spectrum shows an optical gap located around 2-2.5 eV.

Original languageEnglish
Title of host publicationSilicon Carbide and Related Materials 2014
EditorsDidier Chaussende, Gabriel Ferro
PublisherTrans Tech Publications Ltd
Pages974-977
Number of pages4
ISBN (Print)9783038354789
DOIs
Publication statusPublished - 2015
EventEuropean Conference on Silicon Carbide and Related Materials, ECSCRM 2014 - Grenoble, France
Duration: 21 Sep 201425 Sep 2014

Publication series

NameMaterials Science Forum
Volume821-823
ISSN (Print)0255-5476
ISSN (Electronic)1662-9752

Conference

ConferenceEuropean Conference on Silicon Carbide and Related Materials, ECSCRM 2014
Country/TerritoryFrance
CityGrenoble
Period21/09/1425/09/14

Keywords

  • AlSiC
  • High temperature solution growth
  • Raman spectroscopy
  • Single crystal synthesis
  • UV-Vis transmission spectrum

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