TEM investigation of rhombohedral PZT thin films

  • J. Ricote
  • , Q. Zhang
  • , R. W. Whatmore

Research output: Contribution to conferencePaperpeer-review

Abstract

This work analyzes thin films of compositions within the rhombohedral phase of the lead zirconate titanate (PZT) system, and compares the results with previous reports on the structure and physical properties carried out on the same materials, but in the ceramic form. Irrespective of the special characteristics of thin films, the same structural features as in the ceramics were observed. This shows that the origin of the superlattice reflections is not related to a particular characteristic of the ceramic form, but to a fundamental aspect of the crystal structure. The influence of the domain configuration on the physical behaviour is also discussed and compared to the ceramic case.

Original languageEnglish
Pages483-486
Number of pages4
Publication statusPublished - 1998
Externally publishedYes
EventProceedings of the 1998 11th IEEE International Symposium on Appliations of Ferroelectrics (ISAF-XI) - Montreaux, Switz
Duration: 24 Aug 199827 Aug 1998

Conference

ConferenceProceedings of the 1998 11th IEEE International Symposium on Appliations of Ferroelectrics (ISAF-XI)
CityMontreaux, Switz
Period24/08/9827/08/98

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