Temperature dependent capacitance-voltage and conductance-voltage characterisation of the HfO2

Research output: Chapter in Book/Report/Conference proceedingsConference proceedingpeer-review

Original languageUndefined/Unknown
Title of host publicationSemiconductor Interface Specialists Conference, Date: 2008/12/11-2008/12/11, Location: San Diego, CA USA
Publication statusPublished - 2008

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