Abstract
The adsorption of a typical GaAs MOVPE precursor, triethylgallium (TEG) on an As-rich GaAs (100) surface at 300 K is confirmed via Auger and desorption measurements. Desorption data are consistent with the sequential decomposition of a diethylgallium species and indicate that both ethane and ethene are produced in the decomposition of the surface species over the temperature range 300-770 K. The formation of diethylgallium via 300 K adsorption is further supported by AES intensity data which reveal that the surface species has an apparent stoichiometry of 1 Ga to 4(±0.5) C. Carbon (1s VV) lineshapes suggest that the ethyl groups are not significantly perturbed via adsorption.
| Original language | English |
|---|---|
| Pages (from-to) | 972-974 |
| Number of pages | 3 |
| Journal | Vacuum |
| Volume | 41 |
| Issue number | 4-6 |
| DOIs | |
| Publication status | Published - 1990 |