The Role of Oxide Traps Aligned With the Semiconductor Energy Gap in MOS Systems

Research output: Contribution to journal › Article › peer-review

Original language	Undefined/Unknown
Journal	IEEE Transactions on Electron Devices
DOIs	https://doi.org/10.1109/TED.2020.3018095
Publication status	Published - 2020

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@article{94c45c0459cd4cdea9b969f95a16a713,

title = "The Role of Oxide Traps Aligned With the Semiconductor Energy Gap in MOS Systems",

author = "Ailbe O'Manachain",

year = "2020",

doi = "10.1109/TED.2020.3018095",

language = "Undefined/Unknown",

journal = "IEEE Transactions on Electron Devices",

issn = "0018-9383",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

}