THERMAL INTERFACE MATERIAL

Kafil M Razeeb; Saibal Roy; James Francis Rohan; Lorraine Christine Nagle

THERMAL INTERFACE MATERIAL

Kafil M Razeeb (Inventor), Saibal Roy (Inventor), James Francis Rohan (Inventor), Lorraine Christine Nagle (Inventor)

Tyndall MicroNano Systems

UNIVERSITY COLLEGE CORK—NATIONAL UNIVERSITYOF IRELAND

Research output: Patent

Abstract

A thermal interface material (1) comprises a bulk polymer (2) within which is embedded sub-micron (c. 200 to 220 nm) composite material wires (3) having Ag and carbon nanotubes (“CNTs”) 4. The CNTs are embedded in the axial direction and have diameters in the range of 9.5 to 10 nm and have a length of about 0.7 μm. In general the pore diameter can be in the range of 40 to 1200 nm. The material (1) has particularly good thermal conductivity because the wires (3) give excellent directionality to the nanotubes (4)—providing very low resistance heat transfer paths. The TIM is best suited for use between semiconductor devices (e.g. power semiconductor chip) and any type of thermal management systems for efficient removal of heat from the device.

Original language	English
Patent number	US2010196659
IPC	C25D 15/ 00 A I
Priority date	23/04/08
Publication status	Published - 5 Aug 2010

Cite this

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title = "THERMAL INTERFACE MATERIAL",

abstract = "A thermal interface material (1) comprises a bulk polymer (2) within which is embedded sub-micron (c. 200 to 220 nm) composite material wires (3) having Ag and carbon nanotubes (“CNTs”) 4. The CNTs are embedded in the axial direction and have diameters in the range of 9.5 to 10 nm and have a length of about 0.7 μm. In general the pore diameter can be in the range of 40 to 1200 nm. The material (1) has particularly good thermal conductivity because the wires (3) give excellent directionality to the nanotubes (4)—providing very low resistance heat transfer paths. The TIM is best suited for use between semiconductor devices (e.g. power semiconductor chip) and any type of thermal management systems for efficient removal of heat from the device.",

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year = "2010",

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T1 - THERMAL INTERFACE MATERIAL

AU - Razeeb, Kafil M

AU - Roy, Saibal

AU - Rohan, James Francis

AU - Nagle, Lorraine Christine

PY - 2010/8/5

Y1 - 2010/8/5

N2 - A thermal interface material (1) comprises a bulk polymer (2) within which is embedded sub-micron (c. 200 to 220 nm) composite material wires (3) having Ag and carbon nanotubes (“CNTs”) 4. The CNTs are embedded in the axial direction and have diameters in the range of 9.5 to 10 nm and have a length of about 0.7 μm. In general the pore diameter can be in the range of 40 to 1200 nm. The material (1) has particularly good thermal conductivity because the wires (3) give excellent directionality to the nanotubes (4)—providing very low resistance heat transfer paths. The TIM is best suited for use between semiconductor devices (e.g. power semiconductor chip) and any type of thermal management systems for efficient removal of heat from the device.

AB - A thermal interface material (1) comprises a bulk polymer (2) within which is embedded sub-micron (c. 200 to 220 nm) composite material wires (3) having Ag and carbon nanotubes (“CNTs”) 4. The CNTs are embedded in the axial direction and have diameters in the range of 9.5 to 10 nm and have a length of about 0.7 μm. In general the pore diameter can be in the range of 40 to 1200 nm. The material (1) has particularly good thermal conductivity because the wires (3) give excellent directionality to the nanotubes (4)—providing very low resistance heat transfer paths. The TIM is best suited for use between semiconductor devices (e.g. power semiconductor chip) and any type of thermal management systems for efficient removal of heat from the device.

M3 - Patent

M1 - US2010196659

ER -

THERMAL INTERFACE MATERIAL

Abstract

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